Three University of Richmond students and their professor have recently published an article in the journal Review of Scientific Instruments. Their article describes a new technique they invented for correcting certain kinds of imaging and measurement errors that are common in scanning probe microscopy. The students, Nathan Follin ’13, Keefer Taylor ’13, and Chris Musalo ’12, all worked with physics professor Matt Trawick to both develop the new technique and test it on Richmond’s state-of-the-art atomic force microscope. They expect their technique will find wide-scale use in nanotechnology, where accurate measurement and imaging of nanometer-scale features is routinely required.
